定量俄歇分析中确定后向散射因子的新方法

Q. Wang, Q.J. Zhang, Z.Y. Hua
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引用次数: 1

摘要

在定量俄歇分析中,后向散射系数是修正矩阵效应的最重要参数。对一些已发表的方法进行了综述。本文描述了一种利用背景信息确定后向散射系数的新方法,这种信息在俄歇谱中通常被忽略。避免了蒙特卡罗法等复杂的计算,在相同的实验条件下,得到了俄歇电子的强度和背散射电子的能量分布,可以进一步提高精度。对Au-Cu和Ag-Cu两种铜合金进行了定量分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new method to determine backscattering factors for quantitative Auger analysis

The backscattering factor is the most important parameter for matrix effect corrections in quantitative Auger analysis. Some of the methods previously published are reviewed. A new method is described for determining the backscattering factor using information provided by the background which is usually ignored in an Auger spectrum. Complicated calculations such as The Monte Carlo method were avoided, and the accuracy might be further improved since both the intensity of Auger electrons and the energy distribution of backscattered electrons were obtained under the same experimental conditions. The results are illustrated by a quantitative analysis of two copper alloys, Au-Cu and Ag-Cu.

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