高岭石干磨x射线衍射线展宽

Q2 Chemistry
P. Pardo, J. Bastida, M. Kojdecki, R. Ibáñez, M. Zbik
{"title":"高岭石干磨x射线衍射线展宽","authors":"P. Pardo, J. Bastida, M. Kojdecki, R. Ibáñez, M. Zbik","doi":"10.1524/ZKRI.2007.2007.SUPPL_26.549","DOIUrl":null,"url":null,"abstract":"The influence of dry milling on the crystalline microstructure of two kaolinites of different origins is studied by X-ray diffraction (XRD) and by analysing field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) images. Two methods of XRD microstructural analysis are used: the Voigt function and the Warren- Averbach methods; good linear correlation between average apparent crystallite size estimated by both methods is found.","PeriodicalId":23897,"journal":{"name":"Zeitschrift Fur Kristallographie","volume":"1 1","pages":"549-554"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"X-ray diffraction line broadening in dry grinding of kaolinite\",\"authors\":\"P. Pardo, J. Bastida, M. Kojdecki, R. Ibáñez, M. Zbik\",\"doi\":\"10.1524/ZKRI.2007.2007.SUPPL_26.549\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The influence of dry milling on the crystalline microstructure of two kaolinites of different origins is studied by X-ray diffraction (XRD) and by analysing field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) images. Two methods of XRD microstructural analysis are used: the Voigt function and the Warren- Averbach methods; good linear correlation between average apparent crystallite size estimated by both methods is found.\",\"PeriodicalId\":23897,\"journal\":{\"name\":\"Zeitschrift Fur Kristallographie\",\"volume\":\"1 1\",\"pages\":\"549-554\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Zeitschrift Fur Kristallographie\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1524/ZKRI.2007.2007.SUPPL_26.549\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Chemistry\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Zeitschrift Fur Kristallographie","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1524/ZKRI.2007.2007.SUPPL_26.549","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Chemistry","Score":null,"Total":0}
引用次数: 4

摘要

利用x射线衍射(XRD)、场发射扫描电镜(FESEM)和原子力显微镜(AFM)图像分析了干磨对两种不同来源高岭石晶体微观结构的影响。采用了Voigt函数法和Warren- Averbach法两种XRD显微结构分析方法;两种方法估计的平均表观晶粒尺寸之间具有良好的线性相关性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-ray diffraction line broadening in dry grinding of kaolinite
The influence of dry milling on the crystalline microstructure of two kaolinites of different origins is studied by X-ray diffraction (XRD) and by analysing field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) images. Two methods of XRD microstructural analysis are used: the Voigt function and the Warren- Averbach methods; good linear correlation between average apparent crystallite size estimated by both methods is found.
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来源期刊
CiteScore
1.47
自引率
0.00%
发文量
0
审稿时长
3 months
期刊介绍: Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials ISSN 0044-2968 Founded in 1877 by Paul Groth Zeitschrift für Kristallographie is one of the world’s oldest scientific journals. In original papers, letters and review articles it presents results of theoretical or experimental study on crystallography.
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