基于BP-AdaBoost模型和遗传算法的IC仿冒检测研究

Junyan Liu, Xiong-wei Li, Lin-fang Liu, Zhihui Wang, Panfei Du, Kang Li
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引用次数: 0

摘要

针对集成电路中芯片暴露的问题日益突出,以及传统芯片检测方法存在的破坏性问题,提出了一种基于遗传算法优化的BPAdaBoost神经网络模型,并将其应用于芯片检测与分类。利用电磁探头采集不同芯片在相同工作状态下产生的电磁信号,并将电磁辐射信号作为芯片识别和分类的依据,输入经遗传算法优化的BP-AdaBoost模型进行学习和训练。实验结果表明,该方法在芯片识别分类中具有良好的应用效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Counterfeit IC Detection Research Based on BP-AdaBoost Model and Genetic Algorithm
In view of the increasingly prominent problems exposed by chips in integrated circuits and the destructive problems of traditional chip detection methods, a BPAdaBoost neural network model based on genetic algorithm optimization was proposed and applied to chip detection and classification. By using electromagnetic probes to collect the electromagnetic signals generated by different chips in the same operating state and using the electromagnetic radiation signals as the basis for chip identification and classification, the signals are put into the BP-AdaBoost model optimized by genetic algorithm for learning and training. Experimental results show that this method has good effect in the application of chip recognition and classification.
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