聚焦离子束与共振电离质谱耦合分析元素选择性微成像系统的研制

M. Morita, H. Tomita, Ryohei Ohtake, Keita Kanenari, Atsushi Nakamura, Kosuke Saito, Toshihide Kawai, Takeo Okumura, V. Sonnenschein, T. Sakamoto
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引用次数: 2

摘要

森田正人,富田英树,大竹良平,金成庆,中村惇,斋藤孝介,河合俊英,奥村武夫,松南计划Volker,坂本哲夫,歌学院大学应用物理系,中野町2665-1,八千二市,东京,192-0015;名古屋大学量子工程系,日本爱知县名古屋市千草区福罗町,464-8603;日本中子光学公司,爱知县竹岛町20-5,日本,443-0031
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of a micro imaging system for element-selective analysis by coupling of focused ion beam and resonance ionization mass spectrometry
Development of a micro imaging system for element-selective analysis by coupling of focused ion beam and resonance ionization mass spectrometry Masato Morita, Hideki Tomita, Ryohei Ohtake, Keita Kanenari, Atsushi Nakamura, Kosuke Saito, Toshihide Kawai, Takeo Okumura, Volker Sonnenschein and Tetsuo Sakamoto Department of Applied Physics, Kogakuin University, 2665-1 Nakano-machi, Hachioji-shi, Tokyo-to, 192-0015, Japan; Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya-shi, Aichi-ken, 464-8603, Japan; Japan Neutron Optics Inc., 20-5, Takeshima-cho, Gamagori-shi, Aichi-ken, 443-0031, Japan
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