{"title":"硬x射线在线相衬成像的相位检索","authors":"J. An","doi":"10.7498/aps.54.2034","DOIUrl":null,"url":null,"abstract":"In this paper, we analyze hard x-ray in-line phase contrast imaging using Fresnel diffraction of x-ray. Then we propose a linear phase retrieval method based on Transport of Intensity equation (TIE). According to computer simulation for the process of phase contrast imaging and Phase retrieval, this method is tested on simulated images and is demonstrated to be efficient for phase retrieval in the \"near-Fresnel\"region.","PeriodicalId":18640,"journal":{"name":"Microcomputer Information","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Phase retrieval for hard x-ray in-line phase contrast imaging\",\"authors\":\"J. An\",\"doi\":\"10.7498/aps.54.2034\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we analyze hard x-ray in-line phase contrast imaging using Fresnel diffraction of x-ray. Then we propose a linear phase retrieval method based on Transport of Intensity equation (TIE). According to computer simulation for the process of phase contrast imaging and Phase retrieval, this method is tested on simulated images and is demonstrated to be efficient for phase retrieval in the \\\"near-Fresnel\\\"region.\",\"PeriodicalId\":18640,\"journal\":{\"name\":\"Microcomputer Information\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microcomputer Information\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.7498/aps.54.2034\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microcomputer Information","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.7498/aps.54.2034","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Phase retrieval for hard x-ray in-line phase contrast imaging
In this paper, we analyze hard x-ray in-line phase contrast imaging using Fresnel diffraction of x-ray. Then we propose a linear phase retrieval method based on Transport of Intensity equation (TIE). According to computer simulation for the process of phase contrast imaging and Phase retrieval, this method is tested on simulated images and is demonstrated to be efficient for phase retrieval in the "near-Fresnel"region.