大型均匀阵列开发的子阵列设计诊断

T. Brockett, Y. Rahmat-Samii
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引用次数: 2

摘要

使用子阵列已经成为设计大型阵列天线的一种流行方法。使用子阵列简化了阵列设计,允许设计人员专注于较小的子阵列,并在阵列的其余部分重复它。由于子阵设计中的系统误差,在大型均匀阵中会出现异常的光栅瓣。因此,对于子阵列设计者来说,在将子阵列设计纳入更大的阵列之前,能够诊断出子阵列设计中的错误是很重要的。本文将分类并演示可能导致均匀阵列中出现光栅瓣的特定子阵列方向图畸变。此外,一个设计实例将介绍如何识别上述畸变可以用来诊断和防止光栅瓣的出现。这将通过展示使用四个1×4子阵列的1×16线性阵列设计的设计过程来实现。它的设计过程将包括分析、全波模拟和测量部分。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Sub-array design diagnostics for the development of large uniform arrays
The use of sub-arrays has been a popular approach in the design of large array antennas. Using sub-arrays simplifies the array design by allowing the designer to concentrate on the smaller sub-array and repeating it throughout the rest of the array. Anomalous grating lobes have been shown to appear in large uniform arrays caused by systematic errors in the design of sub-array. Thus, it is important for the sub-array designer to be able to diagnose errors in the sub-array design before incorporating it into the larger array. This paper will categorize and demonstrate specific sub-array pattern distortions that can cause grating lobes to appear in uniform arrays. In addition, a design example will present how recognition of the aforementioned distortions can be used to diagnose and prevent the appearance of grating lobes. This will be done by showing the design process of a 1×16 linear array design that uses four 1×4 sub-arrays. Its design progress will include analytical, full-wave simulation, and measurement parts.
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