优化测试程序,提高绝缘子在高电应力下的性能

T. Asokan, T. S. Surdashan
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引用次数: 5

摘要

通过单循环稳定步进、多循环稳定步进、多次射击和山谷试验,研究了表面闪络特性与试验程序的关系。总的来说,测试程序对大带隙绝缘子(如多晶氧化铝和信号晶体石英)在真空中的表面闪络特性有显著影响。稳定步测试在第二天将调节程度提高到更高的水平。然而,接受这些测试的样本在第二天和第三天表现出更高程度的去调节。在多弹试验和山谷试验中,条件作用同时增加,去条件作用同时减少。对不同试验方法下6 μ m-光面氧化铝试样的表面闪络性能进行了比较和讨论。根据表面电子缺陷和吸附的气体原子或分子,解释了给定测试程序下绝缘体的行为。>
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Optimization of test procedure to improve insulator performance under high electric stress
Surface flashover properties in relation to test procedures were investigated, using single-cycle steady step, multiple-cycle steady-step, multiple-shot, and hill-valley tests. In general, the test procedures were found to influence significantly the surface flashover properties of large-bandgap insulators such as polycrystalline alumina and signal-crystal quartz in vacuum. The steady-step tests increased the degree of conditioning to a higher level during the second day. However, the samples subjected to these tests displayed a higher degree of deconditioning during the second and third day. A simultaneous increase of conditioning and decrease of deconditioning was observed for the multiple-shot and hill-valley tests. The surface flashover performances of 6- mu m-finish alumina specimens for different test procedures are also compared and discussed. The behavior of the insulators under a given test procedure is explained on the basis of surface electronic defects and adsorbed gaseous atoms or molecules. >
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