RSFQ细胞的瞬态噪声模拟

H. Töpfer , T.V. Filippov , F.H. Uhlmann
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引用次数: 18

摘要

我们对快速单通量量子RS触发器进行了瞬态噪声模拟,并将计算机结果与先前发展的理论预测进行了比较。计算了与触发器电感相关的误开关概率。结果表明,噪声会使容差范围变窄。这个效果取决于操作频率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Transient noise simulations of RSFQ cells

We performed transient noise simulations of a Rapid Single Flux Quantum RS Flip-Flop and compared computer results with predictions of a previously developed theory. The probability of error switching in dependence on the Flip-Flop inductance was calculated. The results show that noise causes essential narrowing of the tolerance margins. This effect depends on operation frequency.

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