用阶跃压力波法测量介电介质界面载流子阱能态密度分布

Zhang Yewen, Baitun Yang, T. Demin, Yaonan Liu
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引用次数: 9

摘要

采用阶跃压力波法测量了FEP-PMMA(氟化乙烯丙烯-聚甲基丙烯酸甲酯)界面的空间电荷,并研究了室温下空间电荷与放电时间的关系。考虑载流子在界面处跳出陷阱的动态过程,可以确定界面处载流子陷阱能态密度分布。由此得出结论,利用该技术可以获得介电材料中载流子陷阱的信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measuring distribution of carrier trap energy state density at interface of dielectric with step pressure wave method
The space charge at the interface of FEP-PMMA (fluorinated ethylene propylene-polymethyl methacrylate) is measured by the step pressure wave method, and the relationship between the space charge and its discharge time at room temperature is studied. Considering the dynamic process of the carrier jumping out of the trap at the interface, it is possible to determine the carrier trap energy state density distribution at the interface. It is concluded that information about carrier traps in dielectric materials can be obtained by this technique.<>
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