A. Quarterman, J. Carroll, A. Wonfor, R. Penty, I. White
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Measurement of third-order dispersion in a Hong-Ou-Mandel interferometer
The effect of third-order dispersion in a Hong-Ou-Mandel interferometer is investigated using a ZnSe crystal as a dispersive medium. A value for the TOD coefficient of ZnSe is extracted which is consistent with literature values.
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