透明薄膜ITO陷阱中的带电杂化微结构:定位与光学控制

Surfaces Pub Date : 2023-04-19 DOI:10.3390/surfaces6020010

D. Shcherbinin, V. Rybin, S. Rudyi, A. Dubavik, S. Cherevkov, Y. Rozhdestvensky, A. Ivanov

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引用次数: 2

摘要

在本研究中，我们提出了一种新的透明薄膜ITO表面射频(RF)陷阱。带电杂化微结构被定位在发育的ITO阱中。我们通过分析和实验证明，局域化区在被困杂化结构中的位置是稳定的。研究了重力补偿激光辐射作用下带电粒子在局域区之间的转移。我们强调了透明薄膜ITO陷阱在研究和操纵带电粒子方面的优势。

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Charged Hybrid Microstructures in Transparent Thin-Film ITO Traps: Localization and Optical Control

In the present study, we propose a new transparent thin-film ITO surface radio-frequency (RF) trap. Charged hybrid microstructures were localized in the developed ITO trap. We show, analytically and experimentally, that the position of the localization zones in the trapped hybrid structure are stable. The transfer of charged particles between localization zones was studied under the action of gravity-compensating laser radiation. We highlight the advantages of transparent thin-film ITO traps to investigate and manipulate charged particles.

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来源期刊

Surfaces

CiteScore

4.40

自引率

0.00%

发文量