用于多兆焦耳应用的爆炸式熔断器开断开关

J. Goforth, B. Anderson, D. Bartram, C. Findley, O. Garcia, G. J. Heltne, D. Herrera, T. Herrera, J. King, I. Lindemuth, E. Lopez, S. Marsh, E. C. Martinez, M. Thompson, H. Oona, J. Stokes, D. Torres, L. Veeser, M. Yapuncich, W. D. Zerwekh
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引用次数: 3

摘要

高爆炸脉冲功率(HEPP)系统能够在磁场中产生很高的能量。这种储存的能量通常是在几十微秒或几百微秒的时间尺度上开发的。许多应用需要更短的脉冲和打开开关提供了一种方法,以使用大能量可用于更快的应用。随着电流在电感电路中流动,引入电阻产生电压,该电压可用于将电流驱动到负载中。对于电阻上升快的开路开关,负载电流上升时间由电路的R/L时间常数决定。在这个过程中,电路能量的很大一部分必须耗散,在必须处理大量能量的应用中,只能使用几种类型的开关。用高爆驱动的开路开关进行了实验,研制出了几种能承载几十毫安电流的开路开关,开路时间尺度为一个或几个/spl μ s。我们专门研究了一种开关,我们称之为爆炸形成保险丝(EFF),本文的主题是在MJ Procyon系统中使用这种开关。在/spl sim/ 3tw电平下,以2 /spl mu/s的速度运行EFF开关已成为常规操作,我们描述了它的特性并给出了一些测试数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Explosively formed fuse opening switches for multi-megajoule applications
High explosive pulsed power (HEPP) systems are capable of generating very high energies in magnetic fields. Such stored energy is usually developed on time scales of a few tens or hundreds of microseconds. Many applications require shorter pulses and opening switches provide one way to use the large energy available for faster applications. With current flowing in an inductive circuit, introducing resistance produces voltage that can be used to drive current into a load. For an opening switch with a fast rising resistance, the load current rise time is determined by the R/L time constant of the circuit. A significant fraction of the circuit energy must be dissipated in the process, and in applications where very large energies must be dealt with only a few types of switches can be used. Experiments with high explosive driven opening switches have produced a few switches that can carry tens of MA current, and open on the time scale of one or a few /spl mu/s. We have specialized in a type of switch that we call an explosively formed fuse (EFF), and the use of this switch in the is MJ Procyon system is the subject of this paper. Operation of the EFF switch at levels of /spl sim/3 TW for 2 /spl mu/s has become routine, and we describe its characteristics and give data from a number of tests.
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