F6: soc的信号和电源完整性

D. Draper, F. Campi, R. Krishnamurthy, T. Miyamori, S. Morton, W. Sansen, V. Stojanović, J. Stonick
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引用次数: 1

摘要

本次论坛面向未来3-5年从事先进技术研究的研究人员和设计人员。他们将需要解决大型系统芯片应用中出现的信号和电源完整性问题,这将带来越来越困难的问题。在努力提高性能的同时,设计师必须与不断升级的噪音和串音作斗争。互连延迟和耦合将需要新的路由和信号传输方法。通过独立的功率域、主动和被动电源噪声消除以及电压缩放,供电电网设计将越来越多地考虑到有限的封装和芯片金属化。越来越敏感的模拟和射频电路块必须对抗数字芯片噪声。严格的时钟抖动和倾斜目标,以及功耗限制将通过独立时钟域,谐振时钟和频率缩放来解决。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
F6: Signal and power integrity for SoCs
This Forum is directed toward researchers and designers working in advanced technologies over the next 3-5 years. They will be required to solve emerging issues of signal and power integrity in large, System-on-Chip applications which will raise issues of increasing difficulty. While struggling for higher performance, the designer must battle escalating noise and cross-talk. Interconnect delay and coupling will require new methods of routing and signal transmission. Supply-grid design will take increasing account of limited package and chip metalization through independent power domains, active and passive supply-noise cancellation, and voltage scaling. Increasingly- sensitive analog and RF circuit blocks must counter digital chip noise. Stringent clock-jitter and skew targets, and power-dissipation limitations will be addressed by independent clock domains, resonant clocking, and frequency scaling.
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