用薄膜电容器检测裂变碎片——1

L. Tommasino, N. Klein, P. Solomon
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引用次数: 19

摘要

迄今为止,固体介质的重离子探测是通过化学蚀刻实现的。在本文中,裂变碎片的检测是基于固体介质薄膜的击穿计数。这些薄膜用作电容器的介电材料,其电极厚度通常小于1000 A。这种电容器的击穿是非短路的,并且可以重复高达数百万次/平方厘米的电容器面积。使这些电容器适合于检测的特性是,裂变碎片在明显低于单独施加电场的电场下诱发击穿。描述了这些新型检测系统的特点,并与现有的损伤轨迹检测器进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fission fragment detection by thin film capacitors—I

Heavy-ion detection by solid dielectrics has been so far obtained by chemical etching. In this paper the detection of fission fragments is based on the counting of breakdowns in thin films of solid dielectrics. These films are used as dielectric materials in capacitors with one electrode usually less than 1000 A thick. Breakdowns in such capacitors are non-shorting and can be repeated up to millions of times/cm2 of the capacitor area. The property that makes these capacitors suitable for detection is that fission fragments induce breakdowns at electric fields distinctly lower than those due to the application of field alone. The characteristics of these new detecting systems are described and compared with those of the damage-track detectors.

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