PIXE技术在高品位岩石地球化学分析中的应用

Venkata surya satyanarayana Avupati, Prof. Jagannadharao M, Prof. Chandra Mouli K, Prof. Seetaramireddy B
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引用次数: 4

摘要

有一种观点认为,由于包括基质在内的各种原因,地质材料中存在的一些元素是完全确定的,或者根本无法确定。认为需要设计和实施系统的调查,以了解PIXE在某些方面的局限性。选取的高品位岩石分别用pxie和原子吸收光谱法进行了分析,并利用美国地质调查局的参考材料玄武岩和文献研究对分析结果进行了验证。认为可以提高问题元素,特别是来自高品位岩石的问题元素的精度,并可以标准化各种元素在不同组合下的PIXE条件。确定了在某些元素情况下质子诱导X射线发射性能差的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Performance of PIXE Technique through a Geochemical Analysis of High Grade Rocks
It has been an argument that some of the elements present in geological material by using PIXE analysis are purely determined or could not be determined at all, due to various reasons including the matrix. It is felt that a systematic investigation needs to be designed and implemented to understand the limitation of PIXE in certain elements. The high-grade rocks selected are analyzed both by PIXE as well as AAS and the results are authenticated by using a USGS reference material, Basalt, studies of literature. It is believed that the accuracy of problematic elements, especially from high grade rock can be improved and the conditions of PIXE can be standardized for various elements under different combinations. The reasons behind the poor performance of Proton Induced X- ray Emission in case of certain elements have been established.
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