ICP-MS:控制污染和实现低检出限的关键步骤

IF 0.8 4区化学 Q4 SPECTROSCOPY

Spectroscopy Pub Date : 2022-08-01 DOI:10.56530/spectroscopy.vv1589e7

Bert Woods, E. Mccurdy

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引用次数: 0

摘要

电感耦合等离子体质谱(ICP-MS)仪器可以在各种样品类型中进行低水平元素分析，从高纯度化学品到高基质消化。但是，要实现持续的低检测限，需要对元素污染和光谱干扰进行良好的控制。清洁的工作区域，仔细选择试剂，良好的样品处理技术是成功进行痕量和超痕量元素分析的关键。在本文中，我们提供了控制污染物和最小化检测限的五个实用技巧。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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ICP-MS: Key Steps to Control Contamination and Achieve Low Detection Limits

Inductively coupled plasma mass spectrometry (ICP-MS) instruments can perform low-level elemental analysis in a wide range of sample types, from high-purity chemicals to high matrix digests. But achieving consistently low detection limits requires good control of elemental contamination, as well as spectral interferences. A clean working area, careful selection of reagents, and good sample handling techniques are key to successful trace and ultratrace elemental analysis. In this article, we provide five practical tips for controlling contaminants and minimizing detection limits.

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来源期刊

Spectroscopy 物理-光谱学

CiteScore

1.10

自引率

0.00%

发文量

审稿时长

3 months

期刊介绍： Spectroscopy welcomes manuscripts that describe techniques and applications of all forms of spectroscopy and that are of immediate interest to users in industry, academia, and government.