{"title":"太阳能电池加速老化试验","authors":"S. Irsen, D. L. Notarp, H. Kuehnlein, H. Verbunt","doi":"10.1002/IMIC.200990016","DOIUrl":null,"url":null,"abstract":"In situ transmission electron microscopy was used to investigate the ageing behaviour of Si-based solar cells. The structural and compositional changes of the NiSi layer of such cells were determined.","PeriodicalId":100658,"journal":{"name":"Imaging & Microscopy","volume":"30 1","pages":"42-43"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Accelerated Ageing Tests of Solar Cells\",\"authors\":\"S. Irsen, D. L. Notarp, H. Kuehnlein, H. Verbunt\",\"doi\":\"10.1002/IMIC.200990016\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In situ transmission electron microscopy was used to investigate the ageing behaviour of Si-based solar cells. The structural and compositional changes of the NiSi layer of such cells were determined.\",\"PeriodicalId\":100658,\"journal\":{\"name\":\"Imaging & Microscopy\",\"volume\":\"30 1\",\"pages\":\"42-43\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging & Microscopy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/IMIC.200990016\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging & Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/IMIC.200990016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In situ transmission electron microscopy was used to investigate the ageing behaviour of Si-based solar cells. The structural and compositional changes of the NiSi layer of such cells were determined.
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