SF6 - H2O在1000-12000 K温度范围内衰减电弧的组成

Yuwei Fu, Xiaohua Wang, A. Yang, Jiandong Duan
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引用次数: 0

摘要

SF6作为绝缘和灭弧介质广泛应用于电力设备中。但在电弧放电下,sf6解离产生的硫的低氟化物(如SF5、sf4和SF3)会与微量水分杂质中不可避免的原子(如O和H)发生反应,形成SOF2、SO2F2、sof4等腐蚀性副产物。这些副产物会降低sf6绝缘电力设备的绝缘和灭弧能力,因此有必要研究在H2O存在下sf6电弧衰变等离子体的组成。本文采用化学动力学模型同时考虑了非化学平衡和非热力学平衡。用密度泛函理论确定了sf6与H2O的基本反应,用过渡态理论计算了速率系数。然后计算了不同H2O含量下主要副产物SOF2、so2f2和sof4的温度变化摩尔分数。我们还分析了不同温度范围下的优势反应。该工作可为基于特征分解产物的sf6绝缘电力设备绝缘状态监测与诊断奠定理论基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Compositions of SF6 - H2O Decaying Arc at a Temperature Range of 1000–12000 K
SF6 has been widely used as insulating and arc-extinguishing medium in power equipment. But under arc discharges, lower fluorides of sulfur (like SF5, SF4and SF3) generated by the dissociations of SF6will react with unavoidable atoms (like O and H) released from trace impurities of moisture to form corrosive byproducts such as SOF2, SO2F2, SOF4and so on. These byproducts will reduce the insulating and arc-quenching capacity of SF6-insulated power equipment, so it is necessary to study the compositions of decaying SF6arc plasma in the presence of H2O. In this paper, both non-chemical and non-thermodynamic equilibriums are taken into consideration employing chemical kinetic model. The elementary reactions of SF6with H2O are determined by density functional theory and the rate coefficients are computed with transition state theory. Then we calculated the temperature-varying molar fractions of main byproducts SOF2, SO2F2and SOF4under different contents of H2O. We also analyzed the dominant reactions in different selected temperature ranges. This work can lay a theoretical basis for insulating condition monitoring and diagnosis of SF6-insulated power equipment based on characteristic decomposition products.
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