Bi210 β光谱的精密测量

I. Alekseev, S. Bakhlanov, A. Derbin, I. Drachnev, I. Kotina, I. Lomskaya, V. Muratova, N. V. Niyazova, D. Semenov, M. Trushin, E. Unzhakov
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引用次数: 2

摘要

用基于半导体Si(Li)探测器的光谱仪对$^{210}$Bi(历史上称为RaE)的$\beta-$光谱形状进行了精确测量。这第一个被禁止的非唯一跃迁具有强烈偏离统一的跃迁形式因子,对其谱的了解将在$^{210}$Pb背景存在下的低背景物理中发挥重要作用。所测的跃迁形状因子可以近似为$S(W) = 1 + (-0.4363 \pm 0.0037) W + (0.0523 \pm 0.0010) W^2$,这与以往的研究结果很好地吻合,并显著提高了参数精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Precision measurement of the Bi210 β spectrum
The precision measurement of the $\beta-$spectrum shape for $^{210}$Bi (historically RaE) have been performed with a spectrometer based on semiconductor Si(Li) detector. This first forbidden non-unique transition has the transition form-factor strongly deviated from unity and knowledge of its spectrum would play an important role in low-background physics in presence of $^{210}$Pb background. The measured transition form-factor could be approximated as $S(W) = 1 + (-0.4363 \pm 0.0037) W + (0.0523 \pm 0.0010) W^2$, that is in good agreement with previous studies and has significantly increased parameter precision.
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