Sn粒径对PVA-PEG共混物结构和光学性能的影响

Ahmed N. Al-jamal, Qunoot M. Hadi, Farah J. Hamood, K. Abass
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引用次数: 4

摘要

采用铸造技术制备了不同粒径Sn元素(0、10、75和150 ìm)的PVA-PEG-Sn薄膜,薄膜厚度为800 nm。研究了锡添加剂对共混聚合物结构(红外光谱、光学显微镜)和光学性能的影响。光学显微镜图像显示,PVA-PEG-Sn薄膜结构中Sn颗粒分布均匀。利用紫外/1800/ Shimadzu分光光度计记录了PVAPEG- Sn薄膜在190 ~ 1100 nm波长范围内的吸光度,计算了薄膜的光学性能。本研究计算的光学常数发现,这些常数都随着(Sn)粒径的增大而增大。当PVA-PEG-Sn薄膜中Sn粒径为150 ìm时,PVA-PEG-Sn薄膜的光学带隙(Eg)从4.5 eV减小到4.25 eV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Particle Size Effect of Sn on Structure and Optical Properties of PVA-PEG Blend
The Films of PVA-PEG-Sn were prepared with various particle size of Sn element (0, 10, 75 and 150 ìm) by casting method technique with thickness of 800 nm. The effect of Sn additive on structural (FT-IR, optical microscope) and optical properties of polymeric blend has been studied. Optical microscope images indicated the uniform distribution of the Sn particles in the structure of PVA-PEG-Sn films. The optical properties of PVAPEG- Sn films were calculated from recording the absorbance spectra by using spectrophotometer (UV/1800/ Shimadzu) in the wavelength range (190-1100) nm. The optical constants that calculated in this study were found out that all these constants increases with the increase of the particle size of (Sn). The optical band gap (Eg) decreased from 4.5 eV for PVA-PEG film to 4.25 eV as the 150 ìm Sn particle size in the PVA-PEG-Sn film.
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