非相互作用载波的俄歇输运

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) Pub Date : 2018-06-01 DOI:10.1109/PVSC.2018.8548269

L. Abenante, M. Izzi

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引用次数: 0

摘要

在高掺杂条件下，我们假设了一个基于自由载流子俄歇寿命和恒定扩散系数DA的新寿命模型，准确地解决了少数载流子输运问题。本文导出了饱和电流密度的精确表达式，该表达式与已报道的金属涂层n+和p+发射体的测量数据在da值与高掺杂时的扩散率数据一致。生命周期模型与生命周期数据一致。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Auger Transport of Noninteracting Carriers

We solve minority-carrier transport exactly by assuming a new lifetime model based on free-carrier Auger lifetime and constant diffusivity,DA, at high dopings. A new exact expression for saturation current density is derived, which fits measured data in reported sets of metal-coatedn⁺ and p⁺ emitters at DA-value consistent with diffusivity data at high dopings. The lifetime model is shown to be consistent with lifetime data.

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来源期刊

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)

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