用扫描透射电镜探测介电陶瓷的原子尺度结构

IF 2.1 3区物理与天体物理 Q3 PHYSICS, APPLIED

Journal of Advanced Dielectrics Pub Date : 2023-04-20 DOI:10.1142/s2010135x23430014

M. Zhang, Rui Wei, Jinzhe Zeng, Yuan‐Hua Lin

引用次数: 0

摘要

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Probing atomic-scale structure of dielectric ceramics with scanning transmission electron microscopy

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来源期刊

Journal of Advanced Dielectrics PHYSICS, APPLIED-

CiteScore

3.80

自引率

6.50%

发文量

审稿时长

18 weeks

期刊介绍： The Journal of Advanced Dielectrics is an international peer-reviewed journal for original contributions on the understanding and applications of dielectrics in modern electronic devices and systems. The journal seeks to provide an interdisciplinary forum for the rapid communication of novel research of high quality in, but not limited to, the following topics: Fundamentals of dielectrics (ab initio or first-principles calculations, density functional theory, phenomenological approaches). Polarization and related phenomena (spontaneous polarization, domain structure, polarization reversal). Dielectric relaxation (universal relaxation law, relaxor ferroelectrics, giant permittivity, flexoelectric effect). Ferroelectric materials and devices (single crystals and ceramics). Thin/thick films and devices (ferroelectric memory devices, capacitors). Piezoelectric materials and applications (lead-based piezo-ceramics and crystals, lead-free piezoelectrics). Pyroelectric materials and devices Multiferroics (single phase multiferroics, composite ferromagnetic ferroelectric materials). Electrooptic and photonic materials. Energy harvesting and storage materials (polymer, composite, super-capacitor). Phase transitions and structural characterizations. Microwave and milimeterwave dielectrics. Nanostructure, size effects and characterizations. Engineering dielectrics for high voltage applications (insulation, electrical breakdown). Modeling (microstructure evolution and microstructure-property relationships, multiscale modeling of dielectrics).