用于预硅验证和自顶向下设计方法的锁相环的系统verilog行为模型

Amr Lotfy, Syed Feruz Syed Farooq, Qi Wang, Soner Yaldiz, P. Mosalikanti, N. Kurd
{"title":"用于预硅验证和自顶向下设计方法的锁相环的系统verilog行为模型","authors":"Amr Lotfy, Syed Feruz Syed Farooq, Qi Wang, Soner Yaldiz, P. Mosalikanti, N. Kurd","doi":"10.1109/CICC.2015.7338432","DOIUrl":null,"url":null,"abstract":"This paper presents a System-Verilog behavioral model for charge-pump PLLs based on piece-wise constant (PWC) real number modeling and table lookup. The proposed model exploits the sampled nature of the PLL where most of its analog behavior takes effect during the phase detection, and remains almost constant during the rest of the reference cycle. The PLL model simulation run time takes only 1 second, which makes it a perfect fit for pre-silicon digital validation as well as top-down design methodology. Compared to transistor-level Spice simulations, the proposed model shows a correlation of more than 97% for the PLL locking behavior, jitter, and phase noise. The PLL model is used to exercise critical features like spread-spectrum clocking (SSC) and adaptive frequency system (AFS). In addition, the model was integrated in a pre-silicon validation environment and enabled catching design bugs.","PeriodicalId":6665,"journal":{"name":"2015 IEEE Custom Integrated Circuits Conference (CICC)","volume":"28 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A system-verilog behavioral model for PLLs for pre-silicon validation and top-down design methodology\",\"authors\":\"Amr Lotfy, Syed Feruz Syed Farooq, Qi Wang, Soner Yaldiz, P. Mosalikanti, N. Kurd\",\"doi\":\"10.1109/CICC.2015.7338432\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a System-Verilog behavioral model for charge-pump PLLs based on piece-wise constant (PWC) real number modeling and table lookup. The proposed model exploits the sampled nature of the PLL where most of its analog behavior takes effect during the phase detection, and remains almost constant during the rest of the reference cycle. The PLL model simulation run time takes only 1 second, which makes it a perfect fit for pre-silicon digital validation as well as top-down design methodology. Compared to transistor-level Spice simulations, the proposed model shows a correlation of more than 97% for the PLL locking behavior, jitter, and phase noise. The PLL model is used to exercise critical features like spread-spectrum clocking (SSC) and adaptive frequency system (AFS). In addition, the model was integrated in a pre-silicon validation environment and enabled catching design bugs.\",\"PeriodicalId\":6665,\"journal\":{\"name\":\"2015 IEEE Custom Integrated Circuits Conference (CICC)\",\"volume\":\"28 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Custom Integrated Circuits Conference (CICC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2015.7338432\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2015.7338432","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

本文提出了一种基于分段常数(PWC)实数建模和表查找的电荷泵锁相环系统- verilog行为模型。所提出的模型利用了锁相环的采样特性,其中其大部分模拟行为在相位检测期间生效,并且在参考周期的其余部分几乎保持不变。锁相环模型仿真运行时间仅为1秒,这使得它非常适合预硅数字验证以及自上而下的设计方法。与晶体管级Spice模拟相比,所提出的模型显示锁相环锁定行为、抖动和相位噪声的相关性超过97%。锁相环模型用于实现扩频时钟(SSC)和自适应频率系统(AFS)等关键特性。此外,该模型集成在预硅验证环境中,并能够捕获设计错误。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A system-verilog behavioral model for PLLs for pre-silicon validation and top-down design methodology
This paper presents a System-Verilog behavioral model for charge-pump PLLs based on piece-wise constant (PWC) real number modeling and table lookup. The proposed model exploits the sampled nature of the PLL where most of its analog behavior takes effect during the phase detection, and remains almost constant during the rest of the reference cycle. The PLL model simulation run time takes only 1 second, which makes it a perfect fit for pre-silicon digital validation as well as top-down design methodology. Compared to transistor-level Spice simulations, the proposed model shows a correlation of more than 97% for the PLL locking behavior, jitter, and phase noise. The PLL model is used to exercise critical features like spread-spectrum clocking (SSC) and adaptive frequency system (AFS). In addition, the model was integrated in a pre-silicon validation environment and enabled catching design bugs.
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