高亮度电子束中横向空间电荷诱导的微束不稳定性

Physical Review Special Topics-accelerators and Beams Pub Date : 2015-05-11 DOI:10.1103/PHYSREVSTAB.18.054401

M. Venturini, J. Qiang

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引用次数: 5

摘要

我们确定了微束不稳定性产生的新机制，该机制涉及自场的横向而不是纵向成分。我们引入了一个分析模型，该模型捕捉了该效应的基本特征，并使用该模型来解释最近LCLS-II设计研究的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Transverse space-charge induced microbunching instability in high-brightness electron bunches

We identify a new mechanism for generation of the microbunching instability that involves the transverse rather than the longitudinal component of the self-fields.We introduce an analytical model that captures the essential features of the effect and use the model to interpret results from recent LCLS-II design studies.

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来源期刊

Physical Review Special Topics-accelerators and Beams 物理-物理：核物理

自引率

0.00%

发文量

审稿时长

3-8 weeks

期刊介绍： Physical Review Special Topics - Accelerators and Beams (PRST-AB), is a peer reviewed, purely electronic journal, distributed without charge to readers and funded by contributions from national laboratories. It covers the full range of accelerator science and technology: subsystem and component technologies, beam dynamics; accelerator applications; and design, operation, and improvement of accelerators used in science and industry. This includes accelerators for high-energy and nuclear physics, synchrotron radiation production, spallation neutron sources, medical therapy, and intense beam applications.