用磁共振信号宽度测量磁屏蔽内残余磁场

2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF) Pub Date : 2020-07-01 DOI:10.1109/IFCS-ISAF41089.2020.9234902

Yucheng Yang, Jingbiao Chen, Xiang Peng, Teng Wu, Hong Guo

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引用次数: 0

摘要

本文提出了一种测量磁屏蔽中残余磁场的新方法。由于非线性塞曼效应，共振宽度随磁场的增大而增大。通过检测磁共振信号宽度与外加磁场的关系，可以推导出磁屏蔽内的剩余磁场。推导值与真实值的误差可以小于1.5 nT，提高采样率可以减小误差。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measuring Residual Magnetic Field in the Magnetic Shield with Magnetic Resonance Signal Width

In this article, we present a novel method to measure the residual magnetic field in the magnetic shield. Because of the nonlinear Zeeman effect, the magnetic resonance width will grow with the increasing magnetic field. By detecting the dependence of the magnetic resonance signal width on the applied magnetic field, the residual magnetic field in the magnetic shield can be deduced. The error of the deduced value and the true value can be less than 1.5 nT. Higher sampling rate can result in less error.

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2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)

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