由超导体支撑的普通金属单晶上的点接触产生的过量电流

P. Son, H. Kempen, P. Wyder
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引用次数: 2

摘要

在点接触处注入Ag单晶板的电子在Ag- pb界面经过Andreev反射后以空穴的形式聚焦到接触面上。一个小的外加磁场改变聚焦点在点接触直径尺度上的位置。由于空穴产生的过量电流被测量为磁场的函数和电压的函数。结果并不完全符合一个简单的弹道模型。假设电子和空穴在小角度上随机偏转,例如通过位错的远程应变场,可以定性地理解大磁场的偏差。观察到的小磁场和电压下的过量电流的结构可能与点接触区域中散射中心的存在有关,尽管并非所有特征都可以这样解释。相应的长度尺度意味着必须考虑准粒子的波动特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Excess current of a point contact on a normal-metal single crystal backed by a superconductor
Electrons that are injected into a Ag single-crystal slab at a point contact are focused back onto the contact as holes after Andreev reflection at a Ag-Pb interface. A small applied magnetic field shifts the position of the focusing spot on the scale of the point-contact diameter. The excess current due to the holes is measured both as a function of magnetic field and as a functions of voltage. The results do not completely agree with a simple ballistic model. The deviation for large magnetic field can be understood qualitatively by assuming that the electrons and holes are deflected at random over small angles, for instance by the long-range strain field of dislocations. The observed structure of the excess current for small magnetic field and voltage is probably related to the presence of scattering centres in the point-contact area, although not all features can be explained this way. The corresponding length scales imply that the wave character of the quasi-particles has to be taken into account.
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