太赫兹脉冲成像片剂薄膜包衣时程分析

2011 International Conference on Infrared, Millimeter, and Terahertz Waves Pub Date : 2011-12-15 DOI:10.1109/IRMMW-THZ.2011.6105249

T. Sakamoto, K. Nakayama, A. Portieri, D. Arnone, D. Sasakura, P. Taday, A. Zeitler, T. Kawanishi, Y. Hiyama

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引用次数: 0

摘要

采用太赫兹脉冲成像技术对薄膜包衣工艺中片剂包衣的质量特性进行了研究。比较了反射太赫兹脉冲强度和涂层厚度随时间的变化。在工艺开始后30分钟观察涂层的形成情况。

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Time-course analysis of tablet film-coating using terahertz pulsed imaging

Quality attribute of tablet coating on a film-coating process was investigated by a terahertz pulsed imaging. The time-dependent change of intensities of reflex THz pulse and coating layer thicknesses were compared. The forming of coating layer was observed at 30 min after the process was started.

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2011 International Conference on Infrared, Millimeter, and Terahertz Waves

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