强微波辐射作用下薄膜导电结构不可逆过程发展的仿真模型

2014 24th International Crimean Conference Microwave & Telecommunication Technology Pub Date : 2014-11-20 DOI:10.1109/CRMICO.2014.6959669

E. P. Taran, S. Pokrova, V. Starostenko, S. A. Zuev

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引用次数: 0

摘要

本文建立了厚度大于60微米的非均匀导电薄膜在微波辐射作用下不可逆过程发展的模拟模型。该模型考虑了导电膜对微波功率的直接吸收。在考虑电导率随温度变化的情况下，得到了薄膜表面电磁场的分布和热过程的发展动力学。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Simulation model of the development of irreversible processes in film conductive structures under the influence of powerful microwave radiation

This paper presents a simulation model for the development of irreversible processes in inhomogeneous conductive films with a thickness of more than 60 microns under exposure of microwave radiation. The model considers the direct absorption of microwave power by a conductive film. Distribution of the electromagnetic field on the surface of the film and dynamics of development of thermal processes with account for the dependence of the conductivity on temperature is obtained.

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2014 24th International Crimean Conference Microwave & Telecommunication Technology

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