粉末x射线衍射数据在有机材料结构测定中的验证问题

Q2 Chemistry
K. Harris
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引用次数: 3

摘要

利用粉末x射线衍射数据测定有机材料结构的技术现已广泛应用于许多不同的科学研究领域。然而,从粉末衍射数据中确定结构远非一个自动的“黑盒”过程,从这种分析中获得的结果在被指定为有效和正确之前必须经过充分的审查。在这里,我们考虑与该领域相关的验证的两个方面:(i)验证直接空间结构解计算中使用的结构模型,以及(ii)验证从Rietveld细化获得的最终结构。强调了利用其他实验和计算技术获得的信息的优点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Aspects of validation in the structure determination of organic materials from powder X-ray diffraction data
Techniques for structure determination of organic materials from powder X-ray diffraction data are now applied widely in many different fields of scientific research. Nevertheless, structure determination from powder diffraction data is far from an automatic, "black-box" process, and it is essential that the results obtained from such analysis are subjected to adequate scrutiny before they are assigned to be valid and correct. Here we consider two aspects of validation relevant to this field: (i) validation of the structural model used in direct-space structure solution calculations, and (ii) validation of the final structure obtained from Rietveld refinement. The advantages of exploiting information obtained from other experimental and computational techniques are emphasized.
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来源期刊
CiteScore
1.47
自引率
0.00%
发文量
0
审稿时长
3 months
期刊介绍: Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials ISSN 0044-2968 Founded in 1877 by Paul Groth Zeitschrift für Kristallographie is one of the world’s oldest scientific journals. In original papers, letters and review articles it presents results of theoretical or experimental study on crystallography.
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