直流电压下绝缘子表面电荷积累

Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316) Pub Date : 2002-04-07 DOI:10.1109/ELINSL.2002.995966

F. Wang, Q. Zhang, Y. Qiu, E. Kuffel

{"title":"直流电压下绝缘子表面电荷积累","authors":"F. Wang, Q. Zhang, Y. Qiu, E. Kuffel","doi":"10.1109/ELINSL.2002.995966","DOIUrl":null,"url":null,"abstract":"The phenomena of surface charging are investigated using the capacitive probe method. In order to decrease the charge leakage a new type probe with high resolution is designed. The influence of voltage amplitude, duration, polarity and surrounding humidity on the surface charging are studied. The accumulation competition between positive charges and negative charges is observed. The experimental results show that at different places on the insulator surface the surface charging has different saturation time constants.","PeriodicalId":10532,"journal":{"name":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","volume":"11 1","pages":"426-429"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Insulator surface charge accumulation under DC voltage\",\"authors\":\"F. Wang, Q. Zhang, Y. Qiu, E. Kuffel\",\"doi\":\"10.1109/ELINSL.2002.995966\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The phenomena of surface charging are investigated using the capacitive probe method. In order to decrease the charge leakage a new type probe with high resolution is designed. The influence of voltage amplitude, duration, polarity and surrounding humidity on the surface charging are studied. The accumulation competition between positive charges and negative charges is observed. The experimental results show that at different places on the insulator surface the surface charging has different saturation time constants.\",\"PeriodicalId\":10532,\"journal\":{\"name\":\"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)\",\"volume\":\"11 1\",\"pages\":\"426-429\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELINSL.2002.995966\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2002.995966","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 14

摘要

用电容探针法研究了表面充电现象。为了减少电荷泄漏，设计了一种新型的高分辨率探头。研究了电压幅值、持续时间、极性和周围湿度对表面充电的影响。观察到正电荷和负电荷之间的积累竞争。实验结果表明，在绝缘子表面不同位置，表面充电具有不同的饱和时间常数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Insulator surface charge accumulation under DC voltage

The phenomena of surface charging are investigated using the capacitive probe method. In order to decrease the charge leakage a new type probe with high resolution is designed. The influence of voltage amplitude, duration, polarity and surrounding humidity on the surface charging are studied. The accumulation competition between positive charges and negative charges is observed. The experimental results show that at different places on the insulator surface the surface charging has different saturation time constants.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)

自引率

0.00%

发文量