220kv现场失效聚合物绝缘子的傅里叶变换红外光谱分析

Srijib Banerjee, D. Shakthi Prasad
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引用次数: 0

摘要

聚合物绝缘体自问世以来,其应用已呈现出巨大的增长,并在不断升级。聚合物绝缘子暴露在外部环境中,由于其本质是有机的,因此会受到几种应力,聚合物绝缘子会因紫外线、电晕、酸侵蚀、机械和电气应力等而降解。本文对失效的220kv硅橡胶聚合物绝缘子进行了傅里叶变换红外光谱分析。研究了失效绝缘子在不同脱落位置发生的不同物理化学变化。初步调查表明,三水合氧化铝(ATH)填料的损失从失效的绝缘子样品。疏水性的保留在本工作中也有报道。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fourier Transform Infrared Spectroscopic Analysis of Field Failed 220 kV Polymeric Insulators
Polymeric insulators have shown tremendous growth in their application and are under continuous upgradation since their inception. Insulators undergo several stresses as they are exposed to outer environment and being organic in nature, polymeric insulators degrade because of UV, corona, acid attacks, mechanical and electrical stresses etc. This paper presents the Fourier Transform Infrared (FTIR) spectrum analysis of the failed 220 kV silicone rubber polymeric insulators. The occurrence of different physico-chemical changes in the different shed positions of the failed insulators is studied. The preliminary investigation showed the loss of Alumina Tri Hydrate (ATH) filler from the failed insulator samples. Retention of hydrophobicity have also been reported in the present work.
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