单晶聚乙烯的扫描隧道显微镜研究

R. Piner, R. Reifenberger, D. C. Martin, E. L. Thomas, R. P. Apkarian
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引用次数: 12

摘要

扫描隧道显微镜已用于对涂覆有薄Au或Cr覆盖层的单晶聚乙烯薄片进行成像。图像显示了各种不同的形态,从位于原子平坦、高度取向的热解石墨基底上的单晶片层到多层生长过程形成的大型金字塔结构。在许多单个薄片的顶表面上观察到小的生长结构,并发现其与下面的“种子”薄片的边缘对齐。STM研究显示了单晶片层的扇形化以及涉及c轴滑移的重叠片层的塑性变形的证据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A scanning tunneling microscope study of single crystal polyethylene

The scanning tunneling microscope has been used to image single crystal polyethylene lamellae coated with thin Au or Cr overlayers. The images show a variety of different morphologies ranging from single crystal lamella resting on atomically flat, highly oriented pyrolitic graphite substrates to large pyramidal structures formed by a multilayer growth process. Small outgrowth structures were observed on the top surface of many individual lamellae and were found to be in registry with the edge of the underlying “seed” lamella. The STM studies show evidence for sectorization of the single crystal lamella as well as plastic deformation of overlapping lamellae involving c-axis slip.

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