同步辐射激发荧光显微分析新成像技术

Journal of research of the National Bureau of Standards Pub Date : 1988-05-01 DOI:10.6028/jres.093.085

A. Knöchel, M. Bavdaz, N. Gurker, P. Ketelsen, W. Petersen, M. Salehi, T. Dietrich

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引用次数: 2

摘要

[I] Levi Setti，R.，Wang，Y.L.和Crow，G.，Appl。冲浪科学。26249（1986）。[2] Levi Setti，R.，Chabala，J.和王，Y.L.，扫描显微镜。增刊1，13（1987）。[3] 王，李维·塞蒂，R.，查巴拉，J.，扫描显微镜。1（1987）。[41 Williams，D.B.，Levi-Setti，R.，Chabala，J.M.和Newbury，D.E.，J.Microsc.（1987）出版。[51 Williams，D.B.，Levi Setti，R..，Chabal，J.M.，和Newburi，D.E.提交给J.Microsc.[6]Chabala、J.M.、Levi-Setti，R.、Bradley，S.A.和Karasek，K.R.，使用高分辨率扫描离子探针对氮化硅陶瓷进行成像微分析。Appl。冲浪科学。（1987）出版。

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Synchrotron Radiation Excited Fluorescence Micro-Analysis Using a New Imaging Technique

[I] Levi-Setti, R., Wang, Y. L., and Crow, G., Appl. Surf. Sci. 26, 249 (1986). [2] Levi-Setti, R., Chabala, J., and Wang, Y. L., Scanning Micros. Suppl. 1, 13 (1987). [3] Wang, Y. L., Levi-Setti, R., and Chabala, J., Scanning Microsc. 1 (1987). [41 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., J. Microsc. (1987) in press. [51 Williams, D. B., Levi-Setti, R., Chabala, J. M., and Newbury, D. E., to be submitted to J. Microsc. [6] Chabala, J. M., Levi-Setti, R., Bradley, S. A., and Karasek, K. R., Imaging Microanalysis of Silicon Nitride Ceramics with a High Resolution Scanning Ion Microprobe. Appl. Surf. Sci. (1987) in press.

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Journal of research of the National Bureau of Standards

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