Nd-RE-TM薄膜在短波长区的读写特性

M. Ishida;T. Kawase;H. Miyazawa;T. Katsuyama;S. Nebashi;T. Shimoda
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引用次数: 0

摘要

研究了在RE-TM薄膜中添加Nd对磁盘磁光和读写性能的影响。研究发现,随着Nd量的增加,532nm波长下的C/N比得到改善。尽管克尔旋转角增加,但载流子水平没有显著改善。这一事实可以用圆盘的磁光特性来解释,其结果是,随着Nd含量的增加,短波长区域的克尔椭圆率角减小。因此,功绩数字的价值没有得到提高。C/N比的改善是由于噪声水平的降低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Read/Write Properties of Nd-RE-TM Films in the Short-Wavelength Region
The effect of adding Nd to an RE-TM film on the disk's magnetooptic and read/write properties was investigated. It was found that as the amount of Nd was increased, the C/N ratio at a wavelength of 532 nm was improved. In spite of an increase in the Kerr rotation angle, the carrier level was not significantly improved. This fact can be explained by the disk's magnetooptic characteristics, as a result of which the Kerr ellipticity angle decrease in the short-wavelength region as the Nd content was increased. Thus the value of the figure of merit was not improved. The improvement in C/N ratio was due to a decrease in the noise level.
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