XUV波段的宽带高分辨率污名化光谱成像

Pub Date : 2023-08-29 DOI:10.1007/s10946-023-10155-5
A. O. Kolesnikov, A. N. Shatokhin, E. A. Vishnyakov, E. N. Ragozin
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引用次数: 0

摘要

我们描述了高分辨率软x射线光谱仪的实验实现,它在整个操作范围内都是耻辱的。光学结构包括掠入射平面VLS光栅和带非周期多层涂层结构的宽带正入射聚焦镜。工作范围由所使用的非周期多层反射镜定义(Mo/Si: 12.5 - 25 nm;Mo/Be: 11 - 14 nm)。光谱分辨率由CCD探测器分辨率决定,在数值上等于板尺与双像元尺寸的乘积。给出了垂直空间分辨激光产生的多电荷离子等离子体光谱。空间分辨率约为26 μm,是像素尺寸的两倍。我们讨论了在11 nm以下扩展高分辨率柱体光谱成像的前景,并概述了基于非周期Ru/Sr和La/B4C多层结构的宽带正入射反射镜的数值计算数据。
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Broadband High-Resolution Stigmatic Spectral Imaging in the XUV Range

We describe the experimental implementation of high-resolution soft X-ray spectrographs, which are stigmatic throughout their operating range. The optical configuration comprises a grazing-incidence plane VLS grating and a broadband normal-incidence focusing mirror with an aperiodic multilayer coating structure. The operating range is defined by the aperiodic multilayer mirror in use (Mo/Si: 12.5 – 25 nm; Mo/Be: 11 – 14 nm). The spectral resolution is determined by CCD detector resolution and is numerically equal to the product of the plate scale and the double pixel size. Vertically spaceresolved laser-produced plasma spectra of multiply charged ions are presented. The spatial resolution is equal to about 26 μm, the double pixel size. We discuss the prospect of extending high-resolution stigmatic spectral imaging below 11 nm and outline the data of numerical calculations of broadband normal-incidence mirrors based on aperiodic Ru/Sr and La/B4C multilayer structures.

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