物理气相沉积下金属纳米棒的特征长度

Q1 Engineering
Kai-Feng Jun, Bojun Wang, Haiyuan Chen
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引用次数: 0

摘要

利用物理气相沉积(PVD)生长金属纳米棒,特征长度是可控的,可以通过模式I和模式II两种不同的生长模式来识别。在模式1中,金属纳米棒的生长主要由单层表面台阶控制。而在模式II中,生长机制主要由多层表面台阶决定。在这项工作中,我们重点分析了模式一的物理过程,即附着原子开始在单层表面扩散,然后向下扩散到下一个单层表面,最终导致金属纳米棒的生长。从物理过程出发,从理论上提出了特征长度的变化规律和数值解。此外,利用二维晶格动力学蒙特卡罗模拟验证了金属纳米棒生长的理论推导。我们的研究结果为改进基于金属纳米棒的应用和器件的性能提供了一条新的途径。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Characteristic Length of Metallic Nanorods under Physical Vapor Deposition
By using physical vapor deposition (PVD) to grow metallic nanorods, the characteristic length is controllable, which can be identified by two different growth modes: Mode I and Mode II. In Mode I, the growth of metallic nanorods is dominated by the monolayer surface steps. Whereas in Mode II, the growth mechanism is mainly determined by the multilayer surface steps. In this work, we focused on the analysis of the physical process of Mode I, in which the adatoms diffuse on the monolayer surface at beginning, then diffuse down to the next monolayer surface, and finally result in the metallic nanorods growth. Based on the physical process, both the variations of the characteristic length and the numerical solutions were theoretically proposed. In addition, the two-dimensional (2D) lattice kinetic Monte Carlo simulations were employed to verify the theoretical derivation of the metallic nanorods growth. Our results pay a new way for modifying the performance of metallic nanorods-based applications and devices.
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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