f1层不完全发育情况下的电子密度剖面反演

WEI Na, LIU Wen, LU Zhuan-Xia, FENG Jing, YANG Long-Quan, GUO Wen-Ling
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引用次数: 2

摘要

利用垂直入射电离层图反演电子密度分布对于电离层结构和运动、波传播和空间气象应用的研究具有重要意义,因此受到了广泛的关注。F1层发育不完全的回波迹在垂直入射电离图中很常见,通常表现为从F1层到F2层的平滑过渡,在F1层的临界频率处不出现尖峰。然而,现有的电离层模型和反演算法一般针对完全发育的F1层,假设F1层为抛物线型,且F1层的峰值斜率为无穷大,不适用于达到F1层最大电子密度并在F1层的峰值处进入F2层且斜率有限的不完全发育的F1层。在此基础上,引入了F1层不完全展开情况下基于移位切比雪夫多项式的F1层电子密度分布模型,并将模型设定临界频率作为参数。考虑到剖面的平滑性,在上述模型的基础上提出了一种约束优化F1和F2层参数的电子密度剖面反演算法。通过仿真分析了模型和反演算法的有效性,并通过与综合垂直测深&倾斜测深轨迹及实测数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
THE ELECTRON DENSITY PROFILE INVERSION FOR INCOMPLETELY DEVELOPED CASE OF F1 LAYER

The electron density profile inversion from vertical incidence ionograms is essential for research in ionospheric structures and movements, wave propagation and space weather applications, hence has gathered very wide attention. The echo trace of incompletely developed F1 layer is common in vertical incidence ionograms, and it is usually expressed as smooth transition from F1 layer to F2 layer, not a cusp appeared at the critical frequency of F1 layer. However, the existing ionospheric models and inversion algorithms are generally intended for the completely developed F1 layer with the assumptions of a parabolic profile and an infinite slope at the peak of F1 layer, which are not suitable for the profile of incompletely developed F1 layer which achieves the maximum electron density of F1 layer and enters F2 layer at the peak of F1 layer and has a finite slope. Consequently, an F1 layer electron density profile model based on the shifted Chebyshev polynomial for incompletely developed case of F1 layer is introduced with a parameter named as the model setting critical frequency. Taking into account the profile smoothness, an electron density profile inversion algorithm with constrained optimization F1 and F2 layer parameters based on the model mentioned above is proposed. The validity of the model and the inversion algorithm is analyzed through the simulation, and the effectivity of the proposed algorithm is further verified by the comparison between the synthesized vertical sounding & oblique sounding traces and the measured data.

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