紧凑的二维电子分析仪CoDELMA:同时宽倒数和实空间分析使用广角减速镜头,CMA和投影镜头

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY
Hiroyuki Matsuda , Hiroki Momono , László Tóth , Yu Masuda , Koichi Moriguchi , Keiko Ogai , Hiroshi Daimon
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引用次数: 0

摘要

提出了一种紧凑型宽接受角(约±50°)高能分辨率二维电子分析仪CoDELMA (compact DELMA),并进行了构建和测试。CoDELMA由最近提出的变减速比宽接受角静电透镜(VD-WAAEL)、圆柱形反射镜分析仪(CMA)和投影透镜组成。在简要回顾了VD-WAAEL之后,在镜头中使用平面网格是一种新的设计选择,它允许保持对焦角度几乎恒定,而不考虑减速比。详细考虑了CMA和投影透镜的组合,可以同时分析CMA入口处的宽倒数(±8°)和实际空间(±5 mm)。CoDELMA是先前开发的DELMA仪器的继承者,包括一个同心半球形分析仪。由于使用了VD-WAAEL和CMA, CoDELMA的整个系统比DELMA紧凑得多,这大大降低了生产成本。用电子枪作为激发源进行能谱和角分布的测试测量结果证实,能量分辨率和接受角与设计值基本一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Compact 2D electron analyzer CoDELMA: Simultaneous wide reciprocal and real space analysis using wide-angle deceleration lens, CMA and projection lens

A compact wide-acceptance angle (around ± 50°) high-energy-resolution 2D electron analyzer CoDELMA (Compact DELMA) is proposed, constructed and tested. CoDELMA is composed of a recently-proposed variable-deceleration-ratio wide-acceptance-angle electrostatic lens (VD-WAAEL), a cylindrical mirror analyzer (CMA) and a projection lens. After a brief review of VD-WAAEL, the use of a plane grid in the lens is presented as a new design option, which allows keeping the focusing angle almost constant irrespective of the deceleration ratio. A detailed consideration is given to the combination of CMA and a projection lens, which allows simultaneous analysis of wide reciprocal ( ± 8°) and real space ( ± 5 mm) at the entrance of CMA. CoDELMA is the successor to the previously developed DELMA instrument including a concentric hemispherical analyzer. The whole system of CoDELMA becomes much more compact than that of DELMA owing to the use of VD-WAAEL and CMA, and this results in considerable reduction of the production cost. Results of test measurement of energy spectrum and angular distribution using an electron gun as an excitation source confirmed that the energy resolution and the acceptance angle are almost the same as the designed values.

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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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