电子能量损失谱中二阶导数模式的定量评价

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY
J.G. Tobin
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引用次数: 0

摘要

对透射电子显微镜(TEM)中电子能量损失谱(EELS)峰分析的二阶导数模式进行了定量评价。这包括二阶导数峰宽的重要性的演示,精度的二阶依赖于峰宽和频谱中的高频噪声的影响。结果表明,二阶导数法是一种有效而强大的分析方法,但在谱值和推导出的电子量的有效位数方面存在局限性。以铀的n4,5光谱峰和5f居群为例,以UO2 x射线吸收光谱为基准。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A quantitative evaluation of the 2nd derivative mode in electron energy loss spectroscopy

The second derivative mode of peak analysis in electron energy loss spectroscopy (EELS) in a Transmission Electron Microscope (TEM) has been quantitatively evaluated in terms of the accuracy of the method. This includes a demonstration of the importance of the second derivative peak width, the second order dependency of the accuracy upon that peak width and effect of high frequency noise in the spectra. It is shown that while the second derivative method is an efficacious and powerful mode of analysis, there are limitations in terms of the number of significant digits in both the spectral values and derived electronic quantities. The case of uranium N4,5 spectral peaks and the 5f population is presented as an example, with UO2 X-ray Absorption Spectroscopy used as a benchmark.

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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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