高级温控室电阻标准

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION
S. Payagala, A. Panna, A. Rigosi, D. Jarrett
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引用次数: 1

摘要

电阻计量的校准服务不断提高其能力,并建立了维护标准电阻器的新方法和改进方法。尽管这些方法质量很高,但同时测量的电阻器的数量及其空气环境的温度稳定性仍然存在固有的局限性。在此背景下,我们报告了用于标准电阻器的精确温度控制室的设计、开发和初始测试进展,该温度控制室可以提供稳定度为±6 m°C的恒温环境。实现这种稳定性需要基于气流模拟定制腔室设计。此外,微处理器编程允许在未密封的腔室配置内优化气流,以减少腔室温度恢复时间。进行了进一步的测试以提高控制系统的稳定性和腔室的效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Advanced Temperature-Control Chamber for Resistance Standards
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard resistors. Despite the high quality of these methods, there still exist inherent limitations to the number of simultaneous, measurable resistors and the temperature stability of their air environment. In that context, we report progress on the design, development, and initial testing of a precise temperature-control chamber for standard resistors that can provide a constant-temperature environment with a stability of ± 6 m°C. Achieving this stability involved customizing the chamber design based on air-flow simulations. Moreover, microprocessor programming allowed the air flow to be optimized within an unsealed chamber configuration to reduce chamber temperature recovery times. Further tests were conducted to improve the stability of the control system and the efficiency of the chamber.
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来源期刊
自引率
33.30%
发文量
10
审稿时长
>12 weeks
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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