自旋交叉材料中T(LIESST)温度的批判性综述——它是什么,它不是什么

G. Chastanet, C. Desplanches, C. Baldé, P. Rosa, M. Marchivie, P. Guionneau
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引用次数: 38

摘要

自1982年以来,人们一直在溶液中研究光致激发自旋态陷阱,1984年在固态中研究光诱导激发自旋态阱,因为它提供了一种可逆的方式来光交换自旋交叉系统的电子构型。从那时起,通过动力学测量深入研究了光诱导态的寿命。1998年,引入了一种快速简便的方法来记录光诱导态被擦除的极限温度,表示为T(LIESST)。由于该程序易于提供关于光诱导状态的详细信息,且效率高,因此已在自旋交叉社区中广泛使用。例如,已经提出了T(LIESST)与结构参数之间的相关性。然而,它本质上包含一些缺陷,这些缺陷可能导致对行为的误解,并可能导致对其范围的过度估计。本综述旨在介绍和讨论测量T(LIESST)的正确方法,以及它所带来的重要贡献和在解释中不应超过的极限。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A critical review of the T(LIESST) temperature in spin crossover materials − What it is and what it is not
Light-Induced Excited Spin-State Trapping has been studied since 1982 in solution and 1984 in solid state as it offers a reversible way of photoswitching the electronic configuration of spin crossover systems. Since then, the lifetime of the photo-induced state was deeply investigated through kinetics measurements. In 1998, a fast and easy way to record the limit temperature above which the photo-induced state is erased, denoted T(LIESST), was introduced. This procedure has been widely used in the spin crossover community due to its easiness and its efficiency to provide detailed information on the photo-induced state. Correlations between T(LIESST) and structural parameters have been proposed for instance. However, it intrinsically contains drawbacks that can lead to misinterpretation of behaviours and can lead to an over estimation of its scope. This review aims to present and discuss not only the correct way to measure T(LIESST) but also the essential contributions it has brought and the limits not to be exceeded in its interpretation.
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