Sanghamitra Das, S. Dey, Tara Prasanna Dash, E. Mohapatra, J. Jena, C. Maiti
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Impacts of NBTI and hot-carrier stress on silicon nanowire transistor characteristics
Following the downscaling road map for planar metal–oxide–semiconductor field-effect transistors, non-planar (three-dimensional) multiple-gate architectures are becoming essential for the ultimate ...
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