基于压缩vdta的f与Q正交控制T-T滤波器的系统综合

Q1 Engineering
Yongan Li, Yan-Hua Xi, Z. Fan
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引用次数: 0

摘要

基于压差跨导放大器(VDTA)的16个零镜像模型和具有特性频率(fo)和品质因数(Q)之间的正交控制的双托马斯(T-T)滤波器的端口导纳矩阵,采用节点导纳矩阵(NAM)展开法合成了两类不同类型的电压型和跨导型T-T滤波器。使用两个压缩VDTA和两个接地电容器的A类滤波器包括四个结构,使用两个压力VDTA、两个接地电容器和一个接地电阻器的B类滤波器也包括四个构造。这些电路适用于集成电路制造,并且它们的参数fo和Q可以通过改变VDTA的偏置电流来正交地调整。纸笔测试完成后,进行了计算机分析,包括交流(AC)、参数扫描、蒙特卡罗(MC)和噪声分析,以支持综合方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Systematic Synthesis of Compressive VDTA-Based T-T Filter with Orthogonal Control of f o and Q
Based on sixteen nullor-mirror models of the voltage differencing transconductance amplifier (VDTA) and port admittance matrices of the tow-Thomas (T-T) filter with orthogonal control between the characteristic frequency (fo) and figure of merit (Q), two different categories of the voltage-mode and transconductance-mode T-T filters are synthesized by the means of the nodal admittance matrix (NAM) expansion method. The category A filter that employs two compressive VDTAs and two grounded capacitors includes four structures, and the category B filter that uses two compressive VDTAs, two grounded capacitors, and one grounded resistor, also includes four structures. These circuits are suitable for integrated circuit manufacture, and their parameters fo and Q can be orthogonally adjusted with varying the bias currents of VDTAs. After the paper and pencil test is completed, the computer analyses, including alternating current (AC), parameter sweep, Monte Carlo (MC), and noise analyses, are performed to support the synthesis approach.
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来源期刊
Journal of Electronic Science and Technology
Journal of Electronic Science and Technology Engineering-Electrical and Electronic Engineering
CiteScore
4.30
自引率
0.00%
发文量
1362
审稿时长
99 days
期刊介绍: JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas: ¨ Communication Technology ¨ Computer Science and Information Technology ¨ Information and Network Security ¨ Bioelectronics and Biomedicine ¨ Neural Networks and Intelligent Systems ¨ Electronic Systems and Array Processing ¨ Optoelectronic and Photonic Technologies ¨ Electronic Materials and Devices ¨ Sensing and Measurement ¨ Signal Processing and Image Processing JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world.
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