确定粗糙表面接触实际接触面积的数值解析方法

IF 1.6 Q4 MATERIALS SCIENCE, COATINGS & FILMS
Can Wang, D. Schipper
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引用次数: 4

摘要

摘要本研究的目的是提高用半解析法(SAM)计算实际接触面积的精度。研究了两种类型的表面对:一种是针对刚性平面的解析生成的正弦波浪表面,另一种是一对真实的粗糙表面。结果表明,SAM计算的实际接触面积对输入分辨率(即网格尺寸)极为敏感。实际接触区域的SAM结果收敛性较差,特别是在实际粗糙表面的情况下。造成这种差异的主要原因是SAM计算实际接触面积时的“覆盖”效应。在无法进一步细化网格分辨率的情况下,提出了一种指数外推法来预测实际接触面积值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A numerical-analytical approach to determining the real contact area of rough surface contact
ABSTRACT The objective of this study is to improve the accuracy of the real contact area calculated by the semi-analytical method (SAM). Two types of surface pairs are investigated: an analytically generated sinusoidal wavy surface against a rigid flat, and a pair of real rough surfaces. The results suggest that the real contact area calculated by the SAM is extremely sensitive to the resolution of input, i.e. the grid size. The SAM results of the real contact areas show poor convergence, especially in the case of the real rough surfaces. The main reason for this difference is the ‘over-covering’ effect when SAM calculates the real contact area. An exponential extrapolation technique is proposed to predict the real contact area values when further refinement of the grid resolution is unfeasible.
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来源期刊
Tribology - Materials, Surfaces & Interfaces
Tribology - Materials, Surfaces & Interfaces MATERIALS SCIENCE, COATINGS & FILMS-
CiteScore
2.80
自引率
0.00%
发文量
15
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