C. Aßmann, Yinyin Chen, Bryan Keller, Jee-Seon Kim, K. Kim
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Kim","doi":"10.3102/1076998620958383","DOIUrl":null,"url":null,"abstract":"Christian Aßmann, University of Bamberg Guillaume Basse, Stanford University Michela Battauz, University of Udine Eli Ben-Michael, University of CaliforniaBerkeley Howard Bloom, Manpower Demonstration Research Corporation (MDRC) Ulf Bockenholt, Northwestern University Daniel Bolt, University of Wisconsin Eric Bradlow, Wharton School of the University of Pennsylvania Henry Braun, Boston College Katherine Castellano, Educational Testing Service Wendy Chan, University of Pennsylvania Yinghan Chen, University of Nevada, Reno Yinyin Chen, University of Illinois at Urbana-Champaign Yunxiao Chen, London School of Economics and Political Science Edison Choe, Graduate Management Admission Council Steven Culpepper, University of Illinois at Urbana-Champaign Paul De Boeck, The Ohio State University Jimmy de la Torre, The University of Hong Kong Dries Debeer, University of Leuven (KU Leuven) Peng Ding, University of CaliforniaBerkeley Nianbo Dong, University of North Carolina at Chapel Hill Fritz Drasgow, University of Illinois at Urbana-Champaign Keelan Evanini, Educational Testing Service Jean-Paul Fox, University of Twente Mark Fredrickson, University of Michigan Jorge Gonzaléz, Pontificia Universidad Catolica de Chile Simon Grund, Leibniz-Institut fur die Padagogik der Naturwissenschaften und Mathematik an der Universitat Kiel Hongwen Guo, Educational Testing Service Gregory Hancock, University of MarylandCollege Park Ben Hansen, University of Michigan Jeffrey Harring, University of MarylandCollege Park Johannes Hartig, German Institute for International Educational Research (DIPF) Michael Harwell, University of Minnesota Timothy Hayes, Florida International University Yong He, ACT, Inc. 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Acknowledgments
Christian Aßmann, University of Bamberg Guillaume Basse, Stanford University Michela Battauz, University of Udine Eli Ben-Michael, University of CaliforniaBerkeley Howard Bloom, Manpower Demonstration Research Corporation (MDRC) Ulf Bockenholt, Northwestern University Daniel Bolt, University of Wisconsin Eric Bradlow, Wharton School of the University of Pennsylvania Henry Braun, Boston College Katherine Castellano, Educational Testing Service Wendy Chan, University of Pennsylvania Yinghan Chen, University of Nevada, Reno Yinyin Chen, University of Illinois at Urbana-Champaign Yunxiao Chen, London School of Economics and Political Science Edison Choe, Graduate Management Admission Council Steven Culpepper, University of Illinois at Urbana-Champaign Paul De Boeck, The Ohio State University Jimmy de la Torre, The University of Hong Kong Dries Debeer, University of Leuven (KU Leuven) Peng Ding, University of CaliforniaBerkeley Nianbo Dong, University of North Carolina at Chapel Hill Fritz Drasgow, University of Illinois at Urbana-Champaign Keelan Evanini, Educational Testing Service Jean-Paul Fox, University of Twente Mark Fredrickson, University of Michigan Jorge Gonzaléz, Pontificia Universidad Catolica de Chile Simon Grund, Leibniz-Institut fur die Padagogik der Naturwissenschaften und Mathematik an der Universitat Kiel Hongwen Guo, Educational Testing Service Gregory Hancock, University of MarylandCollege Park Ben Hansen, University of Michigan Jeffrey Harring, University of MarylandCollege Park Johannes Hartig, German Institute for International Educational Research (DIPF) Michael Harwell, University of Minnesota Timothy Hayes, Florida International University Yong He, ACT, Inc. Carolyn Hill, Manpower Demonstration Research Corporation (MDRC) Minjeong Jeon, University of CaliforniaLos Angeles Paul Jewsbury, Educational Testing Service Booil Jo, Stanford University Harry Joe, University of British Columbia Matthew Johnson, Educational Testing Service George Karabatsos, University of IllinoisChicago Luke Keele, University of Pennsylvania Augustin Kelava, Eberhard Karls University Tuebingen Journal of Educational and Behavioral Statistics 2020, Vol. 45, No. 6, pp. 771–773 DOI: 10.3102/1076998620958383 Article reuse guidelines: sagepub.com/journals-permissions © 2020 AERA. http://jebs.aera.net