M. G. Dias, R. Ribeiro, Caio M. de A. Barbosa, J. D. de Jesus, M. B. Spósito
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Diagrammatic scale for improved late leaf rust severity assessments in raspberry leaves
Abstract Late leaf rust (Thekopsora americana) is a disease that affects raspberry (Rubus idaeus L.), leading to a decrease in raspberry production. The adoption of precise criteria for disease quantification helps decision-making for its management. A diagrammatic scale (DS) is a useful tool for quantifying disease severity in the field. A DS was developed and validated in this study to estimate late leaf rust severity in raspberry leaves. The DS was defined with eight levels of severity (0.2, 0.4, 0.9, 2.2, 5.1, 11.5, 23.9 and 43.2%). The validation was performed by 15 untrained raters in two steps, with and without using the DS. Two approaches were used for statistical analysis: linear regression and Lin’s method. Both analyses demonstrated that the use of the DS improved the precision and accuracy of the disease estimates. The inter-rater reliability was estimated by the coefficient of determination (R2) and the intra-class correlation coefficient (ICC). Again, the use of the DS improved the reproducibility of the estimates. For the first time, a diagrammatic scale was developed and validated to evaluate late leaf rust severity in raspberry leaves.
期刊介绍:
Canadian Journal of Plant Pathology is an international journal which publishes the results of scientific research and other information relevant to the discipline of plant pathology as review papers, research articles, notes and disease reports. Papers may be submitted in English or French and are subject to peer review. Research articles and notes include original research that contributes to the science of plant pathology or to the practice of plant pathology, including the diagnosis, estimation, prevention, and control of plant diseases. Notes are generally shorter in length and include more concise research results. Disease reports are brief, previously unpublished accounts of diseases occurring on a new host or geographic region. Review papers include mini-reviews, descriptions of emerging technologies, and full reviews on a topic of interest to readers, including symposium papers. These papers will be highlighted in each issue of the journal and require prior discussion with the Editor-in-Chief prior to submission.