基于等离子体能量损失的多层模拟理论

IF 1.8 4区 工程技术
Microscopy Pub Date : 2019-11-01 DOI:10.1093/jmicro/dfaa003
B G Mendis
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引用次数: 6

摘要

研究了小角度非弹性散射的理论条件,其中入射电子可以有效地被视为在均匀电势中移动的粒子。这项工作的动机是最近开发了一种多层方法,该方法使用蒙特卡罗方法将等离子体能量损失与弹性散射相结合。由于等离子体激元激发是离域的,因此假设晶体中入射电子的布洛赫波性质不会影响散射截面。本文表明,对于离域激发,散射截面的混合动态形状因子项为零,散射强度服从泊松分布。这些特征是类粒子散射的特征,并验证了在多层模拟中使用蒙特卡罗方法对等离子体损失进行建模。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theory underpinning multislice simulations with plasmon energy losses
The theoretical conditions for small-angle inelastic scattering where the incident electron can effectively be treated as a particle moving in a uniform potential is examined. The motivation for this work is the recent development of a multislice method that combines plasmon energy losses with elastic scattering using Monte Carlo methods. Since plasmon excitation is delocalized, it was assumed that the Bloch wave nature of the incident electron in the crystal does not affect the scattering cross-section. It is shown here that for a delocalized excitation the mixed dynamic form factor term of the scattering cross-section is zero and the scattered intensities follow a Poisson distribution. These features are characteristic of particle-like scattering and validate the use of Monte Carlo methods to model plasmon losses in multislice simulations.
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来源期刊
Microscopy
Microscopy 工程技术-显微镜技术
自引率
11.10%
发文量
0
审稿时长
>12 weeks
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
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