光子计数32通道ASIC原型测试。

Y Chen, Y Cui, P O'Connor, Y Seo, G S Camarda, A Hossain, U Roy, G Yang, R B James
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引用次数: 0

摘要

BNL正在开发一种用于单光子发射计算机断层扫描(SPECT)应用的碲化镉锌(CZT)探测器的新型低功耗专用集成电路(ASIC)。作为第一步,最近设计并测试了一个32通道ASIC原型。每个通道都有一个前置放大器,然后是CR-RC3整形电路和三个独立的能量箱,带有比较器和16位计数器。采用台积电0.35 μm互补金属氧化物半导体(CMOS)工艺制作ASIC,并在实验室进行了测试。在2.5 v电源下,功耗约为1mw /ch。当增益为400 mV/fC,峰值时间为500 ns时,在室温下,串扰率小于0.3%时,测量到等效噪声电荷(ENC)为360 e-。用于全局阈值的10位dac的积分非线性(INL)小于0.56%,微分非线性(DNL)小于0.33%。在演示中,我们将报告使用该ASIC的详细测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Test of a 32-channel Prototype ASIC for Photon Counting Application.

Test of a 32-channel Prototype ASIC for Photon Counting Application.

Test of a 32-channel Prototype ASIC for Photon Counting Application.

Test of a 32-channel Prototype ASIC for Photon Counting Application.

A new low-power application-specific integrated circuit (ASIC) for Cadmium Zinc Telluride (CZT) detectors for single-photon emission computed tomography (SPECT) application is being developed at BNL. As the first step, a 32-channel prototype ASIC was designed and tested recently. Each channel has a preamplifier followed by CR-RC3 shaping circuits and three independent energy bins with comparators and 16-bit counters. The ASIC was fabricated with TSMC 0.35-μm complementary metal-oxide-semiconductor (CMOS) process and tested in laboratories. The power consumption is around 1 mW/ch with a 2.5-V supply. With a gain of 400 mV/fC and the peaking time of 500 ns, the equivalent noise charge (ENC) of 360 e- has been measured in room temperature while the crosstalk rate is less than 0.3%. The 10-bit DACs for global thresholds have an integral nonlinearity (INL) less than 0.56% and differential nonlinearity (DNL) less than 0.33%. In the presentation, we will report the detailed test results with this ASIC.

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