合格-不合格测试:统计要求和解释。

IF 1.5 4区 工程技术
David Gilliam, Stefan Leigh, Andrew Rukhin, William Strawderman
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引用次数: 15

摘要

探测器系统的性能标准通常包括在指定的统计置信度水平上的探测概率和虚警概率的要求。本文综述了公认的置信水平和临界值的定义。它描述了在期望的置信水平上建立这些概率的测试要求。根据统计软件包和一般电子表格应用程序中现成的功能,这些需求是可计算的。讨论了临界值的统计解释。其中包括一个表格用于说明,并提供了一个图表,显示了通过-失败测试的最低要求数量。这里给出的结果适用于任何性能特征符合二项分布的系统的单侧测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Pass-Fail Testing: Statistical Requirements and Interpretations.

Pass-Fail Testing: Statistical Requirements and Interpretations.

Performance standards for detector systems often include requirements for probability of detection and probability of false alarm at a specified level of statistical confidence. This paper reviews the accepted definitions of confidence level and of critical value. It describes the testing requirements for establishing either of these probabilities at a desired confidence level. These requirements are computable in terms of functions that are readily available in statistical software packages and general spreadsheet applications. The statistical interpretations of the critical values are discussed. A table is included for illustration, and a plot is presented showing the minimum required numbers of pass-fail tests. The results given here are applicable to one-sided testing of any system with performance characteristics conforming to a binomial distribution.

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来源期刊
自引率
33.30%
发文量
10
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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