单电离银的能级、谱线和跃迁概率的关键汇编。

IF 1.5 4区工程技术

Journal of Research of the National Institute of Standards and Technology Pub Date : 2013-04-15 eCollection Date: 2013-01-01 DOI:10.6028/jres.118.009

Alexander Kramida

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引用次数: 25

摘要

所有可用的Ag(+)离子光谱的实验测量是严格审查。从测量波长中去除系统偏移。经过严格评估的波长的汇编列表用于导出具有明确定义的不确定度的能级的综合列表。在两种交替耦合方案中找到了特征向量组成和电平指定。有些旧的工作被发现是不正确的。根据新的能级，得到了电离能的修正值173283(7)cm(-1)，相当于21.4844(8)eV。给出了一组严格评估的转移概率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

A Critical Compilation of Energy Levels, Spectral Lines, and Transition Probabilities of Singly Ionized Silver, Ag II.

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A Critical Compilation of Energy Levels, Spectral Lines, and Transition Probabilities of Singly Ionized Silver, Ag II.

All available experimental measurements of the spectrum of the Ag(+) ion are critically reviewed. Systematic shifts are removed from the measured wavelengths. The compiled list of critically evaluated wavelengths is used to derive a comprehensive list of energy levels with well-defined uncertainties. Eigenvector compositions and level designations are found in two alternate coupling schemes. Some of the older work is found to be incorrect. A revised value of the ionization energy, 173283(7) cm(-1), equivalent to 21.4844(8) eV, is derived from the new energy levels. A set of critically evaluated transition probabilities is given.

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来源期刊

Journal of Research of the National Institute of Standards and Technology Engineering-General Engineering

自引率

33.30%

发文量

期刊介绍： The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.